Self?Healing Cs ₃ Bi ₂ Br ₃ I ₆ Perovskite Wafers for X?Ray Detection

Self-healing of defects imposed by external stimuli such as high energy radiation is a possibility to sustain the operational lifetime electronic devices detectors. Cs3Bi2Br3I6 polycrystalline wafers are introduced here novel X-ray detector material, which not only guarantees stopping power due its composition with elements atomic numbers, but also outperforms other Bi-based semiconductors in respect parameters detection limit, transient behavior, or dark current. The represent size scalable technology suitable for future integration imager medical applications. Most astonishingly, aging these wafer-based results an overall improvement performance—dark currents reduced, photocurrents increased, and one most problematic properties detectors, base line drift reduced orders magnitude. These induced improvements indicate self-healing effects shown result from recrystallization. Optimized synthetic conditions improve prepared detectors; however, aged device all others. Thus, acts optimization tool, certainly restricted this single compound, it expected be beneficial many further ionic semiconductors.